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Hot-point probe

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A hot point probe is a method of quickly determining whether a semiconductor sample is n-type or p-type. The sample is probed using a voltmeter or ammeter and a heat source, such as a soldering iron, is placed on one of the leads. The heat will cause charge carriers (electrons in n-type, holes in p-type) to move away from the lead. The heat from the probe creates an increased number of carriers, which then diffuse away from the contact point. This causes a current/voltage difference.